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INDUSTRIAL OVENS
SEMICONDUCTOR BURN-IN OVEN
Burn-In Testing aims to detect early failures and ensure long-term reliability by exposing components or systems to stress conditions. This helps identify potential defects that could cause failure after deployment.
Equipped with mechanisms to manage and dissipate heat effectively, ensuring uniform temperature distribution and preventing overheating
Specification:
- Volume: 7~21 Cubic Feet
- Temperature Range: Up to 210°C
- Heat Dissipation: 5KW at 125°C
- Temperature Uniformity: +/-3 °C without load at 125 °C
- Control Temperature at 0.5 °C
- Automated for BIB loading/Unloading
Burn-in testing aims to detect early failures and ensure long-term reliability by exposing components or systems to stress conditions. This helps identify potential defects that could cause failure after deployment.
- Volume: 7~21 Cubic Feet
- Temperature Range: Up to 210°C
- Heat Dissipation: 5KW at 125°C
- Temperature Uniformity: +/-3 °C without load at 125 °C
- Control Temperature at 0.5 °C
- Automated for BIB loading/Unloading
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