GT1500-CY-IR-4500 is designed to perform accelerated life testing of Microcircuit
Electronic devices to identify its possibility of early mortalities.

Engineered specifically for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.

It’s application includes Operation Temperature range 60 ºC to 150 ºC  and 5 zone heating control. Designed with Infrared heating , adjustable speed control for conveyor or indexing interval and forced air cooling at outlet.