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INDUSTRIAL OVENS
FIN OVEN
Fin Oven (GT1500-4L-C) is designed to perform accelerated life testing of Microcircuit Electronic devices to identify its possibility of early mortalities.
Engineered specifically for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.
It’s application includes Operation Temperature at 150ºC with control accuracy of +/- 0.5 ºC at 100 ºC and capable of 5 minutes Curing time.
Fin Oven (GT1500-4L-C) is designed to perform accelerated life testing of Microcircuit Electronic devices to identify its possibility of early mortalities.
Engineered specifically for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.
It’s application includes Operation Temperature at 150ºC with control accuracy of +/- 0.5 ºC at 100 ºC and capable of 5 minutes Curing time.
Wafer Holder: Stainless steel card cage forming slot design.
Index : Servo Motor with Gearhead and Driver
Total number of Lane : Single Lane
Input & Output Conveyor : Common drive Twin-belt conveyor with speed control.
Approx. 500 mm length for both Input & Output conveyor.
Exhaust : Manual Damper for exhaust and fresh air inlet. Approx. 100 CFM
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