GT2000-9-PS model oven are designed to perform accelerated life testing of microcircuit electronic devices to identify early mortality.

Used for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.

The Chamber application includes Temperature range up to 200 ºC with heating dissipation capacity of 2.5 KW. Centrifugal fan draws air through the heater section, moves it evenly across the chamber, past the temperature sensors and back to the heater. Fresh air is controlled automatically, depending upon controller outputs.