GENTRON GT2010-14 CHAMBER is designed to perform accelerated life testing of Microcircuit Electronic devices to identify its possibility of early mortalities.
Engineered specifically for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.
It’s application includes Operation Temperature range is at 10 ºC up to 220 ºC and workspace volume of 14 cu. ft.. Designed with reliable temperature control with 16 slots burn-in rack.
GENTRON GT2010-14 IS SPECIFICALLY ENGINEERED FOR APPLICATIONS SUCH AS HIGH DISSIPATION FORWARD BIAS, HIGH TEMPERATURE REVERSE BIAS, DYNAMIC AND STATIC BURN-IN OF INTEGRATED CHIPS AND OTHER SEMICONDUCTOR DEVICES.
|Chamber volume||14 cu. Ft|
|Temperature range||+10 °C to 220 °C|
|Power Consumption||380 VAC, 3 Phase, 50Hz / 60 Hz|
|Control||RKC Temperature Controller|
|Sensor Type||‘J’ Thermocouple|
|Motor full load amperes||3 H.P. / 3.95 A|
|Heating||12 KW / 18.25 A|
|Cooling||5HP, R404A single stage refrigeration system
|Compressor||Full load : 18.5 A|
|Circulating Fan||Centrifugal fan blower, direct drive
Air velocity min. 2 m/s at outlet
Adjustable plates at air outlet
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