The ABTS (Advanced Burn-in and Test System) is a family of innovative and highly flexible systems for the test and/or burn-in of packaged semiconductor devices (Logic, High power Logic or memory.)
Engineered specifically for applications such as high dissipation forward bias, high temperature reverse bias, dynamic and static burn-in of Integrated Chips and other semiconductor devices.
The ABTS (Advanced Burn-in and Test System) is a family of innovative and highly flexible systems for the test and/or burn-in of packaged semiconductor devices (Logic, High power Logic or memory.)
-Logic, Memory and Analog devices
-Engineering and Production Applications
-Multiple Chamber and Parallelism Options
Temperature Range up to 250˚C
Series 304 Stainless steel interior
Controller with RS485 communication output.
Interlocking Door switch.
Back-up High temperature safety.
Direct-driven motor & blower.
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